AN EMPIRICAL MODEL FOR DEVICE DEGRADATION DUE TO HOT-CARRIER INJECTIONTAKEDA E; SUZUKI N.1983; ELECTRON DEVICE LETTERS; ISSN 0193-8576; USA; DA. 1983; VOL. 4; NO 4; PP. 111-113; BIBL. 11 REF.Article

SUBMICROMETER MOSFET STRUCTURE FOR MINIMIZING HOT-CARRIER GENERATIONTAKEDA E; KUME H; TOYABE T et al.1982; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 4; PP. 611-618; BIBL. 19 REF.Article

RELATIONSHIP BETWEEN SKIN HISTIDASE ACTIVITY AND BLOOD HISTIDINE RESPONSE TO HISTIDINE INTAKE IN PATIENTS WITH HISTIDINEMIAKURODA Y; OGAWA T; ITO M et al.1980; J. PEDIATR.; ISSN 0022-3476; USA; DA. 1980; VOL. 97; NO 2; PP. 269-272; BIBL. 15 REF.Article

NEW GROOVED-GATE MOSFET WITH DRAIN SEPARATED FROM CHANNEL IMPLANTED REGION (DSC)TAKEDA E; KUME H; ASAI S et al.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 6; PP. 681-686; BIBL. 8 REF.Article

NEW HOT-CARRIER INJECTION AND DEVICE DEGRADATION IN SUBMICRON MOSFETSTAKEDA E; NAKAGOME Y; KUME H et al.1983; IEE PROCEEDINGS. PART I. SOLID-STATE AND ELECTRON DEVICES; ISSN 0143-7100; GBR; DA. 1983; VOL. 130; NO 3; PP. 144-150; BIBL. 18 REF.Article

ESSAI DE STABILISATION CHIMIQUE DES COUCHES DE LOESS DE KWANTO (CENDRES VOLCANIQUES HOLOCENESWATANABE K; TAKEDA E; AIHARA T et al.1972; BULL. GEOL. SURV. JAP.; JAP. ; 1972, VOL. 23, NUM. 0001, P. 59 A 69Serial Issue

COMPARISON OF CHARACTERISTICS OF N-CHANNEL AND P-CHANNEL MOSFETSTAKEDA E; NAKAGOME Y; KUME H et al.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 6; PP. 675-680; BIBL. 13 REF.Article

EFFECT OF LONG-TERM ADMINISTRATION OF SODIUM BENZOATE TO A PATIENT WITH PARTIAL ORNITHINE CARBAMOYL TRANSFERASE DEFICIENCYTAKEDA E; KURODA Y; TOSHIMA K et al.1983; CLINICAL PEDIATRICS; ISSN 0009-9228; USA; DA. 1983; VOL. 22; NO 3; PP. 206-208; BIBL. 14 REF.Article

SUBMICROMETER MOSFET STRUCTURE FOR MINIMIZING HOT-CARRIER GENERATIONTAKEDA E; KUME H; TOYABE T et al.1982; IEEE J. SOLID-STATE CIRCUITS; ISSN 0018-9200; USA; DA. 1982; VOL. 17; NO 2; PP. 241-248; BIBL. 19 REF.Article

A cross section of VLSI reliability: hot carriers, dielectrics and metallizationTAKEDA, E.Semiconductor science and technology. 1994, Vol 9, Num 5, pp 971-987, issn 0268-1242Article

A note on consistent adjustments of pairwise comparison judgmentsTAKEDA, E.Mathematical and computer modelling. 1993, Vol 17, Num 7, pp 29-35, issn 0895-7177Article

Hot-carrier effects in submicrometre MOS VLSIsTAKEDA, E.IEE proceedings. Part I. Solid-state and electron devices. 1984, Vol 131, Num 5, pp 153-162, issn 0143-7100Article

Hot-carrier effects in sclaed MOS devicesTAKEDA, E.Microelectronics and reliability. 1993, Vol 33, Num 11-12, pp 1687-1711, issn 0026-2714Article

ESSAI DE STABILISATION DU SOL DES DEPOTS LACUSTRES DE SUWAWATANABE K; TAKEDA E.1973; BULL. GEOL. SURV. JAP.; JPN; 1973, VOL. 24, NUM. 0008, P. 403 A 409Serial Issue

PURINE AND PYRIMIDINE ENZYMIC PROGRAMS AND NUCLEOTIDE PATTERN IN SARCOMA = PROGRAMMES ENZYMATIQUES ET ASPECTS DES NUCLEOTIDES PURIQUES ET PYRIMIDIQUES DANS LE SARCOMEWEBER G; BURT ME; JACKSON RC et al.1983; CANCER RESEARCH; ISSN 0008-5472; USA; DA. 1983; VOL. 43; NO 3; PP. 1019-1023; ABS. ENG; BIBL. 18 REF.Article

DETERMINATIONS OF ORGAN OR TISSUE DOSES TO SURVIVORS IN HIROSHIMA AND NAGASAKIHASHIZUME T; MARUYAMA T; NISHIZAWA K et al.1980; J. RADIAT. RES.; ISSN 0449-3060; JPN; DA. 1980; VOL. 21; NO 3-4; PP. 213-230; BIBL. 16 REF.Article

A NEW SENSITIVE METHOD FOR ASSAY OF HISTIDASE IN HUMAN SKIN AND DETECTION OF HETEROZYGOTES FOR HISTIDINEMIAKURODA Y; ITO M; OGAWA T et al.1979; CLIN. CHIM. ACTA; NLD; DA. 1979; VOL. 96; NO 1-2; PP. 139-144; BIBL. 7 REF.Article

COMPILATION OF DATA ON ROCKS STANDARDS JG-1 AND JB-1 ISSUED FROM THE GEOLOGICAL SURVEY OF JAPAN.ANDO A; KURASAWA H; OHMORI T et al.1971; GEOCHEM. J.; JPN; 1971, VOL. 5, NUM. 0004, P. 151 A 164Miscellaneous

A verification theorem of preference separability for additive value functionsYU, P. L; TAKEDA, E.Journal of mathematical analysis and applications. 1987, Vol 126, Num 2, pp 382-396, issn 0022-247XArticle

Challenges for giga-scale integrationTAKEDA, E.Microelectronics and reliability. 1997, Vol 37, Num 7, pp 985-1001, issn 0026-2714Article

Submicron VLSI technologySEKI, K; TAKEDA, E.Hitachi review. 1991, Vol 40, Num 1, pp 1-6, issn 0018-277XArticle

Study of the magnetic coupling between a SQUID and wires integrated on a chipTAKEDA, E; NISHINO, T.IEEE transactions on applied superconductivity. 1996, Vol 6, Num 1, pp 45-49, issn 1051-8223Article

The impact of N^- drain length and gatedrain/source overlap on submicrometer LDD devices for VLSIIZAWA, R; TAKEDA, E.IEEE electron device letters. 1987, Vol 8, Num 10, pp 480-482, issn 0741-3106Article

A fully depleted lean-channel transistor (DELTA): a novel vertical ultrathin SOI MOSFETHISAMOTO, D; KAGA, T; KAWAMOTO, Y et al.IEEE electron device letters. 1990, Vol 11, Num 1, pp 36-38, issn 0741-3106Article

Characterization of the sticking effect of TFT-LCDsNANNO, Y; MINO, Y; TAKEDA, E et al.Proceedings of the society for information display. 1990, Vol 31, Num 4, pp 295-299, issn 0734-1768Article